Methods and apparatus for repairing inoperative pixels in a display

ABSTRACT

Methods and apparatus for repairing inoperative pixels in a display are provided. In particular, the present invention provides methods and apparatus for improving the effective yield rates of displays, such as liquid crystal micro-displays, by disconnecting inoperative pixels from their defective drive circuitry and tying such pixels to the working drive circuit of a nearby pixel. A display can be repaired without the need to provide redundant drive circuitry underneath each pixel.

BACKGROUND OF THE INVENTION

The present invention provides methods and apparatus for repairinginoperative pixels in a display. In particular, the present inventionprovides methods and apparatus for improving the effective yield ratesof displays, such as liquid crystal micro-displays, by disconnectinginoperative pixels from their defective drive circuitry and tying suchpixels to the working drive circuit of a nearby pixel.

Manufacturing of displays, such as liquid crystal (LC) micro-displays,with very large numbers of pixels is hampered by low yield rates due tothe large area of semiconductor material (e.g., Complementary MetalOxide Semiconductor (CMOS)) required for each device. Nevertheless,displays can actually tolerate a certain level of various types ofdefects and still be considered acceptable. Additionally, there arevarious techniques that have been developed and successfully applied toother display technologies that can reduce the visibility of some typesof defects and dramatically increase the yield of acceptable displays.

For example, on a device size suitable to hold 8 million pixels(approximately 32×58 mm), without any repair strategy, the yield of“perfect” display devices is estimated at less than 2% (assumed defectrate of 0.2/cm²).

Defects in the microelectronic circuitry can cause a variety of types ofmalfunctions in the resulting display, such as:

Stuck-ON Pixel These pixels are always ON. In a three-chip RGB (red,green, blue) system, they would be visible as a constant red, green, orblue dot in the display. Such stuck-ON pixels are much more visible indark areas of the display than bright areas. Stuck-OFF Pixel Thesepixels are always OFF. In a three-chip RGB system, they would be visibleas a constant cyan, magenta, or yellow dot in the display. Suchstuck-OFF pixels are much more visible in the bright areas of thedisplay than the dark areas. Stuck-Intermediate Some pixels can getstuck in an intermediate state. Depending on the intended color of thepixel and the surrounding area of the display, they will sometimesappear as red, green, or blue, and at other times will appear as thecomplement of the color channel affected. Partial Response Some pixelsmay have a portion of their circuitry affected such that they partiallyrespond to the intended color. Perhaps they are of reduced intensity orcontrast, but they still track the intended value to some degree.Defective Clump A significant portion of the circuitry in the visiblearea may be shared between clumps of pixels. A defect in this area mayeffect the entire clump of pixels and may take any of the above forms.Dead Column/Row Defects in signals generated by the drive circuitrywhich are fed to every pixel in a column or row will manifest themselvesin the entire column or row. The manifestation may take a variety offorms.

Although a display having any of the foregoing defects may still beuseable, all such defects are significant enough that once noticed, theuser will be unhappy. The only exception being perhaps a few isolatedstuck-OFF pixels in the display used for the blue channel, due to thelow contrast sensitivity of human vision to blue light.

A previously known method for dealing with such defects is to provideredundant circuitry in the display that can be selected to drive a pixelor column of pixels in the event of a defect in the primary circuitry.As it is already difficult to fit all required circuitry in the spaceavailable in such micro-displays, the inclusion of redundant circuitrybecomes problematic.

It would be advantageous to provide a method of repairing inoperativepixels in a display without requiring redundant circuitry in order toincrease the yield rate of such displays.

The methods and apparatus of the present invention provide theaforementioned and other advantages.

SUMMARY OF THE INVENTION

The present invention provides methods and apparatus for repairinginoperative pixels in a display. In particular, the present inventionprovides methods and apparatus for improving the effective yield ratesof displays, such as liquid crystal micro-displays, by disconnectinginoperative pixels from their defective drive circuitry and connectingsuch pixels to the working drive circuit of a nearby pixel.

The “repaired” pixel will then display the same value as the nearbypixel that it is connected to. However, since in most images,neighboring pixels are highly likely to be displaying similar values,the resulting slight error in the image is very well below acceptablelimits for almost all applications. Most viewers find it difficult todetect such an artifact at all even when it is pointed out to them. Asthe display resolution goes higher, this type of repair becomes evenmore difficult to detect.

In an illustrated embodiment of the present invention, an electronicdisplay is provided which is capable of repairing inoperative pixels.The display comprises a plurality of pixels with drive circuitry forcontrolling the pixels. Means for disconnecting an inoperative pixelfrom its defective drive circuitry are provided. The inoperative pixelis then provided with a connection to a working drive circuit of anearby pixel.

The means for connecting the inoperative pixel to a working drivecircuit may comprise additional circuitry associated with each pixel inthe display. This additional circuitry connects the inoperative pixel tothe working drive circuit of a nearby pixel.

In one embodiment, the additional circuitry may comprise a bypass bitlatch. When the bypass bit is set, the defective drive circuitry isbypassed and the inoperative pixel is driven from the working drivecircuit of a nearby pixel. The bypass bit may be loaded from an externalmemory after the display is turned ON. In addition, multiplexingcircuitry associated with the bypass bit latch may be provided.

Alternatively, the additional circuitry may further comprise a tri-statetransistor associated with each pixel connected to the bypass bit latchand a resistor coupling neighboring pixels. When the bypass bit is set,the transistor is switched to bypass the defective drive circuitry sothat the inoperative pixel is driven from the working drive circuit of anearby pixel through the resistor.

In a further embodiment, the additional circuitry may comprise aresistive connection between neighboring pixel metal layers. Thedefective drive circuitry can be disconnected from the inoperative bysevering a via connecting the defective drive circuitry to theinoperative pixel, such that the inoperative pixel is driven by a nearbypixel through the resistive connection.

Alternatively, the additional circuitry may comprise a capacitiveconnection between neighboring pixel metal layers. The defective drivecircuitry can be disconnected from the inoperative pixel by severing avia connecting the defective drive circuitry to the inoperative pixel,such that the inoperative pixel is driven by a nearby pixel through thecapacitive connection.

The via may be severed, for example, by laser ablation, melting orablation of a fusible link by passing sufficient current through it,selective chemical etching using a photoresist or other selection means,melting or ablation with an electron beam, melting or ablation with afocused microwave or other electro-magnetic beam, electro-ionic erosion,physical cutting or removal of the metal using a sharp or abrasiveimplement or probe, or by any other suitable technique.

The pixels may be repaired individually or in groups (i.e., groups of upto 8 adjacent inoperative pixels may be repaired without significantlyimpacting the quality of the display).

In a further embodiment, the display may also comprise test circuitry toidentify the defective drive circuitry.

The pixel drive circuitry associated with each pixel may be locatedadjacent to each pixel or located separately from each pixel.

The display may be a liquid crystal micro-display or a similar displaydevice.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an embodiment of a liquid crystal micro-displayassembly in accordance with the present invention;

FIG. 2 shows a schematic representation of an embodiment of repaircircuitry in accordance with the present invention;

FIG. 3 shows a schematic representation of a further embodiment ofrepair circuitry in accordance with the present invention;

FIG. 4 shows an alternate embodiment of repair circuitry in accordancewith the present invention;

FIG. 5 shows another alternate embodiment of repair circuitry inaccordance with the present invention; and

FIG. 6 shows examples of various pixel repair configurations.

DETAILED DESCRIPTION OF THE INVENTION

The present invention relates to methods and apparatus for repairinginoperative pixels in a display. In particular, the present inventionprovides methods and apparatus for improving the effective yield ratesof displays, such as liquid crystal micro-displays, by disconnectinginoperative pixels from their defective drive circuitry and connectingsuch pixels to the working drive circuit of a nearby pixel.

The invention is particularly adapted for use with a traditionalreflective Ferro-electric liquid crystal on complimentary metal oxidesemiconductor (FLC-on-CMOS) micro-display assembly with the LC materialbeing placed on top of a CMOS control chip. Pads on the top layer of theCMOS chip provide both electrical control of the LC material as well asthe optical mirror for the light.

Such a display may have 8.3 million pixels arranged as 3840 pixels by2160 pixels. The pixels may be on a 15 μm pitch. The size of the activearea of this exemplary display is thus 57.6×32.4 mm. Additional controlcircuitry and frame buffer memory (e.g., Dynamic Random Access Memory(DRAM)) along the two long sides of the circuit may be 61.4×3 mm.Input/output (I/O) pads and an LCD seal ring would add another couplefew millimeters to the overall dimensions of the chip, but these areaswould be relatively immune from the very small defects typical of theCMOS process. The invention is also applicable to displays of varyingsizes and types.

A significant amount of functionality in the circuitry under each pixelis desired. The basic modulation for each pixel may be, for example, a10-bit counter running on a chirped clock to produce a log orgamma-corrected response. Generation of the pulse timing required by theLC material is also required under each pixel. Diagnostic capabilitiesmay be included to verify correct operation of the control circuit foreach pixel. Finally, an additional 10 bits of storage may be desired toallow loading of the data for a next frame to be distributed over theentire frame time.

Fitting this circuitry in the available space has proven challenging anddrives the design towards a larger pixel pitch compared to existingdesigns. The smallest feasible CMOS feature sizes are also utilized.Even still, for the desired complex pixel control functionality, typicalprior art redundant repair circuitry is problematic to provide in theavailable space.

FIG. 1 illustrates the arrangement of a liquid crystal-micro display inaccordance with the present invention. Display area 10 is divided intoseveral sections due to the differing impacts that defects in eachsection will have on the display yield. Pixel drive and repair circuitry12 covers the majority of the device area (e.g., the pixel drivecircuitry comprises 92% of the active area or approximately 17.2 cm² andthe pixel repair circuitry comprises 4% of the active area orapproximately 0.07 cm²). By providing the repair mechanisms describedherein, most types of defects in this circuitry can be tolerated andstill result in acceptable devices.

Signal distribution buffer circuitry 14 may comprise 4% of the activearea of the display or approximately 0.07 cm². Signals in the displayare routed to every pixel in a column. Distribution buffer circuitry 14will be required to fan these signals out over the large number of loadsand distances and still meet timing requirements. Defects in thesebuffers will render large portions of the display inoperable and renderthe display unusable.

Column signal generation logic (1.2 cm²) and Buffer DRAM (1.8 cm²) areprovided at 16. Column signal generation logic generates the signals foreach column. Defects in this area are highly likely to render the entiredisplay unusable since the error is likely to impact a large area of thedisplay such as an entire column or more. Buffer DRAM is similar toconventional DRAM. If yield is a problem in this area, traditional DRAMtechniques of including spare rows and columns can be employed.

Input/output (I/O) pads 18 are provided. These features typically do notcontribute to low yield. Cover Glass Glue-Down Area 20 also consumes aportion of the wafer, but typically does not have any features thatwould contribute to low yield.

In an illustrated embodiment of the present invention as shown in FIG.1, an electronic display 10 is provided which is capable of repairinginoperative pixels. The display comprises a plurality of pixels withdrive circuitry 12 for controlling the pixels. Means for disconnectingan inoperative pixel from its defective drive circuitry are provided.The inoperative pixel is then provided with a connection to a workingdrive circuit of a nearby pixel.

Using the drive circuitry 12 of a neighboring pixel to drive anotherwise inoperative pixel will result in the two pixels displaying thesame intensity. Visual artifacts will typically be visible in the caseof high contrast textures and edges moving across the two tied-togetherpixels at a slow rate.

The means for connecting the inoperative pixel to a working drivecircuit may comprise additional circuitry associated with each pixel inthe display that connects the inoperative pixel to the working drivecircuit of a nearby pixel. The additional circuitry may comprisediscrete or integrated circuitry.

In one embodiment as shown in FIG. 2, the additional circuitry maycomprise bypass bit latches 34, 44 which can select the source of thedrive signal for pixels 30, 40. When a bypass bit is set, the defectivedrive circuitry is bypassed and the inoperative pixel is driven from theworking drive circuit of a nearby pixel. The bypass bit may be loadedfrom an external memory after the display is turned ON. For example, inFIG. 2, assume that pixel 30 is inoperative due to defective drivecircuitry 32. After the display is turned ON, bypass bit 34 associatedwith the inoperative pixel 30 is set such that defective drive circuitry32 is bypassed and inoperative pixel 30 is driven by working drivecircuitry 42 of a nearby pixel 40. In addition, multiplexing circuitry36, 46 associated with bypass bit latches 34, 44 may be provided. Anadvantage of such an arrangement is that testing and repair can beaccomplished at any time in the manufacturing process, even afterassembly of the LCD.

As shown in FIG. 3, the additional circuitry may alternatively comprisetri-state transistors 38, 48 associated with each respective pixel 30,40. Transistors 38, 48 are connected to respective bypass bit latches34, 44 and resistor 50 couples neighboring pixels 30, 40. Resistor 50may be any suitable resistor, such as a discrete resistor, an integratedcircuit resistor fabricated in metal, polysilicon, or any other suitableresistive material. As an example, assume that pixel 30 is inoperativedue to defective drive circuitry 32. When bypass bit 34 is set, thetransistor 38 is switched to bypass defective drive circuitry 32 so thatinoperative pixel 30 is driven from working drive circuit 42 of nearbypixel 40 through the resistor 50. An advantage of such an arrangement isthat testing and repair can be accomplished at any time in themanufacturing process, even after assembly of the LCD.

In a further embodiment as shown in FIG. 4, the additional circuitry maycomprise a resistor 52 coupled between pixel metal layers of nearbypixels 31, 41. Resistor 52 may comprise a discrete or integrated circuitresistor fabricated in metal, polysilicon, or any other suitableresistive material. Assuming that pixel 31 is inoperative due todefective drive circuitry 32, defective drive circuitry 32 can bedisconnected from the inoperative pixel 31 by severing a via 55connecting defective drive circuitry 32 to inoperative pixel 31, suchthat inoperative pixel 31 is driven by a nearby pixel 41 through theresistor 52. Because the pixel drive waveform typically consists ofpulses of very low duty cycle, resistor 52 typically will not contributesignificantly to the power dissipation of the device.

Additionally, since the current flowing for each pixel typically is verysmall, resistor 52 typically will be sufficient to drive the pixel 31with essentially the same waveform as pixel 41.

As shown in FIG. 5, the additional circuitry may alternatively comprisea capacitor 54 coupled between pixel metal layers of nearby pixels 31,41. Assuming pixel 31 is inoperative due to defective drive circuitry32, the defective drive circuitry 32 can be disconnected from theinoperative pixel by severing a via 55 connecting the defective drivecircuitry 32 to the inoperative pixel 31, such that the inoperativepixel 31 is driven by a nearby pixel 41 through the capacitor 54.Capacitor 54 may be formed from a pixel metal layer normally used forlight-blocking or may comprise any other suitable capacitive connection.

The via 55 may be severed, for example, by laser ablation, melting orablation of a fusible link by passing sufficient current through it,selective chemical etching using a photoresist or other selection means,melting or ablation with an electron beam, melting or ablation with afocused microwave or other electromagnetic beam, electro-ionic erosion,physical cutting or removal of the metal using a sharp or abrasiveimplement or probe, or by any other suitable technique. The via 55 maycomprise a fuseable link between the drive circuitry and the pixel, andthe link may be “blown”, e.g., by applying a suitable short circuitvoltage across the link, or by any other suitable technique.

The pixels may be repaired individually or in groups. In one embodimentof the invention, the amount of circuitry per pixel is reduced bysharing the bypass bit latch amongst a group of pixels. If the drivecircuit for any pixel in the group fails, the bypass bit is set for thatgroup, and each pixel in the group is then driven by the circuitry of anearby pixel. The drive circuit used for each repaired pixel may bedifferent or the same for each pixel in the group. Even though someworking pixels are bypassed in the group, the overall quality of thedisplay is still improved by removing the stuck-ON or stuck-OFFdefect(s). Groups may be any size depending on the demands of theapplication, but typically groups larger than 8 pixels begin to havediminishing returns in terms of space saved in relation to quality ofthe repair.

FIG. 6 shows examples of various pixel repair configurations, includingexamples of individual pixel repair and examples of various pixel repairgroupings. In the repair example 100, the defective pixels 101 may bedriven by an adjacent pixel located either to the left or the right ofthe defective pixel (e.g., pixels 102 and 103). In repair example 200, a4 pixel group (2×2) of defective pixels is repaired by driving thedefective pixels 201 using the drive circuitry of pixels located to theleft (202, 203) or the right (204, 205) of the 4 pixel group. In repairexample 300, an 8 pixel group (4×2) of defective pixels 301 is repairedusing pixels located above (302, 303), below (304, 305), to the left(306, 307) and to the right (308, 309). In repair example 400, a 16pixel group (4×4) of defective pixels 401 is repaired using pixels above(402, 403), below (404, 405), to the left (406, 407, 408, 409), and tothe right (410, 411, 412, 413). Pixels 402, 403, 404, and 405 are shownas driving a respective adjacent pixel as well as a respective pixellocated in the interior of the 4×4 defective pixel block 401. It will beappreciated that any of the other pixels (406-413) can be used to drivean adjacent pixel and an interior pixel.

The repair examples shown in FIG. 6 are illustrative examples, and itwill be appreciated that a defective pixel may be driven by any of theadjacent pixels (including for example, pixels located above, below, ordiagonally from the defective pixels). Further, it will be appreciatedthat defective pixels may be repaired by connecting the defective pixelsto the drive circuitry of non-adjacent pixels (as shown, for example, inrepair example 400).

In a further embodiment, the display may also comprise test circuitry toidentify the defective drive circuitry. For example, all the pixels in arow may be tested in parallel using wired-OR and wired-AND circuitry.Rows with an inoperative pixel will then be subject to an additionalseries of tests to identify the exact pixel in the row that isinoperative.

The pixel drive circuitry associated with each pixel may be locatedadjacent to each pixel or located separately from each pixel. Moving thedrive circuitry for each pixel so it is not necessarily physicallylocated under the pixel that it drives allows for nearby repair partnerpixels with non-adjacent drive circuitry. Depending on the size ofdefects that may occur, the drive circuitry for repair partners can belocated one, two, or more pixels away from the pixels that they drive.Since the total number of defects typically is small, the probability oftwo independent defects damaging any given pair of repair partner pixelsbecomes negligible.

The display may be a liquid crystal micro-display or other suitabledisplays that comprise integrated circuit manufacturing techniques.

It should now be appreciated that the present invention provides animproved method and apparatus for repairing inoperative pixels in adisplay. In particular, the invention provides an improved method andapparatus for repairing defective pixels in a liquid crystalmicro-display without the need to provide redundant drive circuitryunderneath each pixel.

Although the invention has been described in connection with variouspreferred embodiments, it should be appreciated that numerousadaptations and modifications can be made thereto without departing fromthe scope of the invention as set forth in the claims. In particular,the invention is not limited to liquid crystal micro displays, and canbe used in connection with the many different types of displaytechnology.

1. A method for mitigating defects caused by inoperative pixels in aliquid crystal micro-display built on a silicon integrated circuitsubstrate, the substrate having an integral complimentary metal-oxidesemiconductor (CMOS) control chip containing CMOS drive circuitry, thedrive circuitry comprising a plurality of pixel drive circuits, eachpixel drive circuit electrically connected to a corresponding pixel, themethod comprising: identifying a defective pixel drive circuitelectrically connected to an inoperative pixel; disconnecting theelectrical connection between the defective pixel drive circuit and theinoperative pixel; and electrically connecting the inoperative pixel toa working pixel drive circuit coupled to a nearby pixel such that thedefective pixel drive circuit is bypassed and the inoperative pixel isdriven from the working pixel drive circuit of the nearby pixel, thenearby pixel comprising one of an adjacent pixel or a non-adjacentpixel.
 2. A method in accordance with claim 1, wherein electricallyconnecting comprises using a bypass bit latch comprising a bypass bit,and wherein the bypass bit is loaded from an external memory after thedisplay is turned on.
 3. A method in accordance with claim 1, furthercomprising: multiplexing the drive circuits of each pixel with the drivecircuit of a nearby pixel.
 4. A method in accordance with claim 1,wherein electrically connecting comprises using a bypass bit latchcomprising a bypass bit, and wherein the method further comprises:providing a tn-state transistor associated with each pixel which isconnected to the bypass bit latch; and providing a resistor for couplingneighboring pixels; such that when the bypass bit is set, the transistoris switched to bypass the defective pixel drive circuit so that theinoperative pixel is driven from the working pixel drive circuit of anearby pixel through the resistor.
 5. A method in accordance with claim1, wherein defects of the inoperative pixels are mitigated in groups. 6.A method in accordance with claim 1, wherein identifying defective pixeldrive circuit further comprises providing test circuitry associated withthe display.
 7. A method in accordance with claim 1, wherein the pixeldrive circuitry associated with each pixel is located separately fromeach pixel.
 8. A liquid crystal micro-display apparatus capable ofmitigating defects caused by inoperative pixels, comprising: a pluralityof pixels; a complimentary metal-oxide semiconductor (CMOS) control chipintegral to a silicon integrated circuit substrate of the micro display,the CMOS control chip comprising a plurality of pixel drive circuits,each pixel drive circuit electrically connected to a correspondingpixel, means for disconnecting the electrical connection between thedefective pixel drive circuit and an inoperative pixel; and a means forelectrically connecting the inoperative pixel to a working pixel drivecircuit of a nearby pixel, such that the defective pixel drive circuitis bypassed and the inoperative pixel is driven from the working pixeldrive circuit of the nearby pixel, the nearby pixel comprising one of anadjacent pixel or a non-adjacent pixel.
 9. Apparatus in accordance withclaim 8, wherein the means for electrically connecting comprises abypass bit latch comprising a bypass bit that is loaded from an externalmemory after the display is turned on.
 10. Apparatus in accordance withclaim 8, further comprising: multiplexing circuitry associated with theconnecting means.
 11. Apparatus in accordance with claim 8, wherein themeans for electrically connecting comprises a bypass bit latchcomprising a bypass bit, and wherein the apparatus further comprises: atri-state transistor associated with each pixel connected to the bypassbit latch; and a resistor coupling neighboring pixels; such that whenthe bypass bit is set, the transistor is switched to bypass thedefective pixel drive circuit so that the inoperative pixel is drivenfrom the working pixel drive circuit of a nearby pixel through theresistor.
 12. Apparatus in accordance with claim 8, wherein defects ofthe inoperative pixels are mitigated in groups.
 13. Apparatus inaccordance with claim 8, further comprising test circuitry to identifythe defective pixel drive circuit.
 14. Apparatus in accordance withclaim 8, wherein the pixel drive circuitry associated with each pixel islocated separately from each pixel.
 15. A method in accordance withclaim 1, wherein the defective CMOS pixel drive circuit is identifiedafter the CMOS control chip and the liquid crystal material areassembled together.
 16. A method in accordance with claim 15, whereinthe inoperative pixel is identified via an optical inspection of thedisplay after assembly of the display.
 17. Apparatus in accordance withclaim 8, wherein the defective CMOS pixel drive circuit is identifiedafter the CMOS control chip and the liquid crystal material areassembled together.
 18. Apparatus in accordance with claim 17, whereinthe inoperative pixel is identified via an optical inspection of thedisplay after assembly of the display.